Spectral Engineering of InSe Nanobelts for Full-Color Imaging by Tailoring the Thickness
Release time:2022-04-28
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Impact Factor:5.7
DOI number:10.1021/acs.jpclett.2c00518
Journal:The Journal of Physical Chemistry Letters
Key Words:HIGH-PERFORMANCE;LAYERED INSE;TRANSISTORS;NANOSHEETS
Abstract:In this work, we report on the synthesis of InSe nanobelts through a catalyst-free chemical vapor deposition (CVD) growth approach. A remarkable blue shift of the peakphotoresponse was observed when the thickness of the InSe nanobelt decreases from 562 to165 nm. Silvaco Technology Computer Aided Design (TCAD) simulation reveals that such ashift in spectral response should be ascribed to the wavelength-dependent absorptioncoefficient of InSe, for which incident light with shorter wavelengths will be absorbed near thesurface, while light with longer wavelengths will have a greater penetration depth, leading to ared shift of the absorption edge for thicker nanobelt devices. Considering the above theory,three kinds of photodetectors sensitive to blue (450 nm), green (530 nm), and red (660 nm)incident light were achieved by tailoring the thickness of the nanobelts, which can enable thespectral reconstruction of a purple"H"pattern, suggesting the potential application of 2Dlayered semiconductors in full-color imaging
Co-author:Kai-Jun Cao, Yu-Xuan Le, Jing-Yue Li, Chen-Yue Zhu, Li Wang, Yu-Xue Zhou, Di Wu, Lin-Bao Luo
First Author:Chun-Yan Wu
Correspondence Author:Chun-Yan Wu, Lin-Bao Luo
Document Type:Article
Volume:13
Issue:12
Page Number:2668-2673
ISSN No.:1948-7185
Translation or Not:no
Date of Publication:2022-03-31