研究领域

• 集成电路容错设计与测试

论文成果

• Aibin Yan, et al.，HITTSFL: Design of a Cost-Effective HIS-Insensitive TNU-Tolerant and SET-Filtering Latch for Safety-Critical Applications:IEEE/ACM Design Automation Conference
• Aibin Yan, et al.，Novel Speed-and-Power-Optimized SRAM Cell Designs with Enhanced Self-Recoverability from Single- and Double-Node Upsets:IEEE Transactions on Circuits and Systems I: Regular Papers
• Aibin Yan， et al.，Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications:IEEE Transactions on Aerospace and Electronic Systems
• Aibin Yan, et al.，Information Assurance through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment:IEEE Transactions on Computers
• Aibin Yan, et al.，MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-based Verification Method:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

专利成果

• Aibin Yan, et al., 一种N-1级故障过滤表决器发明,2024/02/05
• Aibin Yan, et al., 基于C单元的三节点翻转自恢复锁存器发明,2022/10/14
• Aibin Yan, et al., 一种容忍任意三节点翻转并过滤瞬态脉冲的锁存器发明,2022/10/14
• Aibin Yan, et al., 一种任意三节点翻转完全自恢复的锁存器发明,2022/10/14
• Aibin Yan, et al., 一种三个内部节点翻转完全免疫的锁存器发明,2021/05/25

著作成果

• Aibin Yan, et al.,集成电路器件抗辐射加固设计技术,科学出版社,2024

科研项目

• 纳米集成电路软错误率评估关键技术研究
• 抗单粒子多节点翻转与多瞬态的加固单元设计研究
• 抗辐射加固存储单元电路的设计与测试的研究