合肥工业大学主页平台管理系统陈创创--中文主页-- [7] C. Chen, J. Liu, J. Zhu, H. Gu, and S. Liu, “Resolution-enhanced reflection ptychography with axial distance calibration,” Opt. Lasers Eng., vol. 169, p. 107684, Oct. 2023, doi: 10.1016/j.optlaseng.2023.107684.

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[7] C. Chen, J. Liu, J. Zhu, H. Gu, and S. Liu, “Resolution-enhanced reflection ptychography with axial distance calibration,” Opt. Lasers Eng., vol. 169, p. 107684, Oct. 2023, doi: 10.1016/j.optlaseng.2023.107684.

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上一条： [6] C. Chen, H. Gu, and S. Liu, “Noise-robust ptychography using dynamic sigmoid-remolding,” Opt. Laser Technol., vol. 172, no. December 2023, p. 110510, May 2024, doi: 10.1016/j.optlastec.2023.110510.