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Deep technology tracing for high-tech companies

Release time:2022-03-17 Hits:

Journal: IEEE International Conference on Data Mining (ICDM)
Co-author:Han Wu, Kun Zhang, Guangyi Lv, Qi Liu, Runlong Yu, Weihao Zhao, Enhong Chen, Jianhui Ma
First Author:Han Wu
Indexed by:会议
Correspondence Author:Enhong Chen
Page Number:1396-1401
Translation or Not:no
Date of Publication:2019-11-08