Ultra-Sensitive Narrow-Band P-Si Schottky Photodetector With Good Wavelength Selectivity and Low Driving Voltage
Release time:2024-01-27
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Impact Factor:4.9
DOI number:10.1109/LED.2023.3331048
Journal:IEEE Electron Device Letters
Key Words:Narrowband photodetector;silicon;wavelength selectivity;gain mechanism
Abstract:Narrowband photodetectors have attracted considerable attention owing to their ability to suppress interference from nontarget wavelengths. However, operation of sensitive narrowband detection usually requires a high driving voltage, which leads to high power consumption and severe degradation of device performance. In this study, a narrowband 1050 nm photodetector with high sensitivity and excellent wavelength selectivity was realized using a simple p -type Si Schottky junction. The device exhibited a high responsivity of 810 mA/W and a large linear dynamic range of 128 dB at zero bias. At a low bias voltage of -3 V, its external quantum efficiency increased to 6.9 x 10(3) %, with a full width at half maximum of approximately 74 nm. This outstanding device performance can be ascribed to the unique geometry of dual Ti /Ag Schottky electrode and the gain mechanism derived from the large transit-time difference between the photogenerated electrons and holes. This study opens new avenues for the development of highly sensitive narrowband photodetectors with low driving voltages in the future.
Co-author:Yi-Fei Wang, Shao-Jian Long, Yan Pan, Xiao-Ping Yang, Chun-Yan Wu, YanWang, Lin-Bao Luo, Li Wang
First Author:Huan-Huan Zuo
Correspondence Author:Lin-Bao Luo, Li Wang
Document Type:Article
Volume:45
Issue:1
Page Number:68-71
ISSN No.:0741-3106
Translation or Not:no
Date of Publication:2023-11-08