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Associate professor

Supervisor of Master's Candidates

E-Mail:

Date of Employment:2022-01-03

School/Department:电气工程系

Administrative Position:学院外事秘书

Education Level:Postgraduate (Doctoral)

Business Address:逸夫楼603

Gender:Male

Degree:Doctoral degree

Status:Employed

Alma Mater:德国亚琛工业大学

Discipline:Power Electronics and Transmission

Zhiqing Yang

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Gender:Male

Education Level:Postgraduate (Doctoral)

Alma Mater:德国亚琛工业大学

Paper Publications

Short Circuit Protection of Silicon Carbide MOSFETs: Challenges, Methods, and Prospects

Impact Factor:6.6
DOI number:10.1109/TPEL.2024.3430897
Journal:IEEE Transactions on Power Electronics
Key Words:Robustness, short-circuit protection, silicon carbide (SiC) MOSFETs , soft turn-OFF strategies
Abstract:With the fabulous growth of the renewable energy industry, silicon carbide (SiC) metal-oxide-semiconductor field-effect transistors ( mosfet s) are increasingly finding applications in various scenarios. To ensure the safe operation of SiC mosfet s, there is a pressing need for fast and reliable short-circuit protection methods. This article aims to give a detail overview of the existing short-circuit protection technologies for SiC mosfet s regarding their merits and limitations. First, the challenges associated with short-circuit protection are comprehensively analyzed. Subsequently, thorough comparisons of state-of-the-art short-circuit detection methods and soft turn- off strategies are conducted, respectively. Finally, this work outlines the prospects of short-circuit protection technologies in the aspects of deficiencies and optimization of short-circuit protection in multichip power module with paralleled SiC mosfets.
Indexed by:Journal paper
Discipline:Engineering
Document Type:J
Volume:39
Issue:10
Page Number:13081 - 13095
ISSN No.:0885-8993
Translation or Not:no
Date of Publication:2024-07-19
Included Journals:SCI
Links to published journals:https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=63