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一种基于卷积去噪自编码器的芯片表面缺陷检测方法
Release time: 2022-03-20
Hits:
Service Invention or Not:
no
Attachments:
【发明专利证书】一种基于卷积去噪自编码器的芯片表面缺陷检测方法.jpg
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一种保留颌骨骨折线的3D模型重构方法
Next One:
一种芯片表面印刷符号结构缺陷的质量评估方法
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Doctoral degree
Luo Yuetong
Recommended MA Supervisor
Hefei University of Technology
MOBILE Version