Name (Simplified Chinese): 闫爱斌
Name (Pinyin): yanaibin
School/Department: 集成电路系
Gender: Male
Status: Employed
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MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-based Verification Method
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Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
First Author:Aibin Yan, et al.
Indexed by:Journal paper
Translation or Not:no
Links to published journals:http://doi.org/10.1109/TCAD.2024.3357593
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