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Home > Scientific Research > Patents

基于磁耦合器的发热部件的损耗测量方法及装置

Release time:2026-03-21 Hits:

Affilication of Author(s):香港城市大学
 Type of Patent:Invent
 State of Patent:Pending patent
 Application Number:202510261672.6
 Service Invention or Not:no
 Application Date:2025-03-06

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