Translation or Not:no
Pre One : [3] C. Chen, Y. Zhou, W. Li, L. Liu, H. Gu, and S. Liu, “High throughput defect inspection and ptychographic review for EUV mask,” in AOPC 2022: Optical Sensing, Imaging, and Display Technology, Y. Wang, B. Xue, Y. Jiang, X. Wang, and D. Liu, Eds., SPIE, Jan. 2023, p. 70. doi: 10.1117/12.2651662.
Next One : [5] C. Chen, H. Gu, and S. Liui, “Self-adaptive noise minimization for diffractive imaging via regularized regression,” in AOPC 2023: Optical Sensing, Imaging, and Display Technology and Applications; and Biomedical Optics, Y. Jiang, X. Wang, L. Cao, Q.-H. Wang, D. Liu, B. Xue, Y. Wang, and C.-Y. Lu, Eds., SPIE, Dec. 2023, p. 11. doi: 10.1117/12.3003704.
E-Mail:
Date of Employment:2024-09-09
School/Department:光电信息科学与工程系
Education Level:With Certificate of Graduation for Doctorate Study
Business Address:合肥工业大学科技楼603
Gender:Male
Degree:Doctoral degree
Status:Employed
Alma Mater:华中科技大学
Email :
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